METHODS FOR FINE FEATURE DETAIL FOR ADDITIVE MANUFACTURING

The present disclosure generally relates to methods for additive manufacturing (AM) that utilize a computer aided design (CAD) model of a part to develop a layer representation of the part. The method includes: determining a build layer thickness of an additive manufacturing apparatus; identifying a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: DeLeon, Johnny, Sands, Travis Gene, Riffe, Cory J, Kruse, Jerod C
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The present disclosure generally relates to methods for additive manufacturing (AM) that utilize a computer aided design (CAD) model of a part to develop a layer representation of the part. The method includes: determining a build layer thickness of an additive manufacturing apparatus; identifying a feature of the part within the model; determining that the feature is not aligned along the z-axis based on the build layer thickness; and moving the feature within the model along the z-axis by a feature offset such that the feature is aligned along the z-axis.