NON-CONTACT MATERIAL INSPECTION

This disclosure relates to non-contact inspection of material for identifying and estimate composition of a material under inspection. Traditionally, material inspection is an invasive process involving contact based approaches. A radar-based approach requires placement of the radar at a specific lo...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: RANI, SMRITI, DAS, RAJAT KUMAR, SINHARAY, ARIJIT, GIGIE, ANDREW, CHAKRAVARTY, TAPAS
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:This disclosure relates to non-contact inspection of material for identifying and estimate composition of a material under inspection. Traditionally, material inspection is an invasive process involving contact based approaches. A radar-based approach requires placement of the radar at a specific location, which is a challenge since amplitude of the reflected signal, depends on the distance from the material under inspection. The present disclosure addresses this technical problem by providing a Continuous Wave radar-based approach that is based on absolute slope at extrema points on the reflected signal from the material under inspection.