ION SOURCES WITH IMPROVED CLEANING BY ABLATING LIGHT

An ion source for a mass spectrometer comprising a light source arranged to output light for ablating contaminant material (11) accumulated on an electrode surface. The light source comprises a laser in optical communication with a beam profiling apparatus configured to transform an input laser beam...

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Bibliographische Detailangaben
Hauptverfasser:	KALININA, Diana Vladimirovna, ALLISON, John Mark
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS CLEANING CLEANING IN GENERAL ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY PERFORMING OPERATIONS PREVENTION OF FOULING IN GENERAL TRANSPORTING
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Beschreibung
Zusammenfassung:	An ion source for a mass spectrometer comprising a light source arranged to output light for ablating contaminant material (11) accumulated on an electrode surface. The light source comprises a laser in optical communication with a beam profiling apparatus configured to transform an input laser beam or pulse(s) from said laser having a Gaussian laser beam intensity profile into an output having a substantially square laser beam intensity profile. Corresponding method of outputting light for ablating contaminant material.