IMPROVED CHARGED PARTICLE DETECTOR

Components of scientific analytical equipment and to complete items of analytic equipment. An apparatus and methods useful for detecting an ion in mass spectrometry applications are provided. The apparatus may include an electron multiplier having a high sensitivity and low sensitivity sections, or...

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Bibliographische Detailangaben
Hauptverfasser: STRESAU, Richard, HUNTER, Kevin, SHEILS, Wayne
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:Components of scientific analytical equipment and to complete items of analytic equipment. An apparatus and methods useful for detecting an ion in mass spectrometry applications are provided. The apparatus may include an electron multiplier having a high sensitivity and low sensitivity sections, or the combination of an electron multiplier with a separately powered conversion dynode (and particularly a high energy conversion dynode), or the combination of a conversion dynode that is physically incorporated within or about an electron multiplier.