BEAM HARDENING CORRECTION IN X-RAY DARK-FIELD IMAGING
The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imag...
Gespeichert in:
| Hauptverfasser: | , , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; ger |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | KOEHLER, Thomas DE MARCO, Fabio YAROSHENKO, Andriy MAACK, Hanns-Ingo NOEL, Peter WILLER, Konstantin GROMANN, Lukas, Benedict |
| description | The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information maybe used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3612095A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3612095A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3612095A13</originalsourceid><addsrcrecordid>eNrjZDB1cnX0VfBwDHJx9fP0c1dw9g8KcnUO8fT3U_D0U4jQDXKMVHBxDPLWdfN09XFR8PR1dAcq42FgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BxmaGRgaWpo6GxkQoAQBu_ybM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>BEAM HARDENING CORRECTION IN X-RAY DARK-FIELD IMAGING</title><source>esp@cenet</source><creator>KOEHLER, Thomas ; DE MARCO, Fabio ; YAROSHENKO, Andriy ; MAACK, Hanns-Ingo ; NOEL, Peter ; WILLER, Konstantin ; GROMANN, Lukas, Benedict</creator><creatorcontrib>KOEHLER, Thomas ; DE MARCO, Fabio ; YAROSHENKO, Andriy ; MAACK, Hanns-Ingo ; NOEL, Peter ; WILLER, Konstantin ; GROMANN, Lukas, Benedict</creatorcontrib><description>The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information maybe used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging.</description><language>eng ; fre ; ger</language><subject>DETECTING MASSES OR OBJECTS ; DIAGNOSIS ; GEOPHYSICS ; GRAVITATIONAL MEASUREMENTS ; HUMAN NECESSITIES ; HYGIENE ; IDENTIFICATION ; MEASURING ; MEDICAL OR VETERINARY SCIENCE ; PHYSICS ; SURGERY ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200226&DB=EPODOC&CC=EP&NR=3612095A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200226&DB=EPODOC&CC=EP&NR=3612095A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KOEHLER, Thomas</creatorcontrib><creatorcontrib>DE MARCO, Fabio</creatorcontrib><creatorcontrib>YAROSHENKO, Andriy</creatorcontrib><creatorcontrib>MAACK, Hanns-Ingo</creatorcontrib><creatorcontrib>NOEL, Peter</creatorcontrib><creatorcontrib>WILLER, Konstantin</creatorcontrib><creatorcontrib>GROMANN, Lukas, Benedict</creatorcontrib><title>BEAM HARDENING CORRECTION IN X-RAY DARK-FIELD IMAGING</title><description>The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information maybe used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging.</description><subject>DETECTING MASSES OR OBJECTS</subject><subject>DIAGNOSIS</subject><subject>GEOPHYSICS</subject><subject>GRAVITATIONAL MEASUREMENTS</subject><subject>HUMAN NECESSITIES</subject><subject>HYGIENE</subject><subject>IDENTIFICATION</subject><subject>MEASURING</subject><subject>MEDICAL OR VETERINARY SCIENCE</subject><subject>PHYSICS</subject><subject>SURGERY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDB1cnX0VfBwDHJx9fP0c1dw9g8KcnUO8fT3U_D0U4jQDXKMVHBxDPLWdfN09XFR8PR1dAcq42FgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BxmaGRgaWpo6GxkQoAQBu_ybM</recordid><startdate>20200226</startdate><enddate>20200226</enddate><creator>KOEHLER, Thomas</creator><creator>DE MARCO, Fabio</creator><creator>YAROSHENKO, Andriy</creator><creator>MAACK, Hanns-Ingo</creator><creator>NOEL, Peter</creator><creator>WILLER, Konstantin</creator><creator>GROMANN, Lukas, Benedict</creator><scope>EVB</scope></search><sort><creationdate>20200226</creationdate><title>BEAM HARDENING CORRECTION IN X-RAY DARK-FIELD IMAGING</title><author>KOEHLER, Thomas ; DE MARCO, Fabio ; YAROSHENKO, Andriy ; MAACK, Hanns-Ingo ; NOEL, Peter ; WILLER, Konstantin ; GROMANN, Lukas, Benedict</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3612095A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2020</creationdate><topic>DETECTING MASSES OR OBJECTS</topic><topic>DIAGNOSIS</topic><topic>GEOPHYSICS</topic><topic>GRAVITATIONAL MEASUREMENTS</topic><topic>HUMAN NECESSITIES</topic><topic>HYGIENE</topic><topic>IDENTIFICATION</topic><topic>MEASURING</topic><topic>MEDICAL OR VETERINARY SCIENCE</topic><topic>PHYSICS</topic><topic>SURGERY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KOEHLER, Thomas</creatorcontrib><creatorcontrib>DE MARCO, Fabio</creatorcontrib><creatorcontrib>YAROSHENKO, Andriy</creatorcontrib><creatorcontrib>MAACK, Hanns-Ingo</creatorcontrib><creatorcontrib>NOEL, Peter</creatorcontrib><creatorcontrib>WILLER, Konstantin</creatorcontrib><creatorcontrib>GROMANN, Lukas, Benedict</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KOEHLER, Thomas</au><au>DE MARCO, Fabio</au><au>YAROSHENKO, Andriy</au><au>MAACK, Hanns-Ingo</au><au>NOEL, Peter</au><au>WILLER, Konstantin</au><au>GROMANN, Lukas, Benedict</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>BEAM HARDENING CORRECTION IN X-RAY DARK-FIELD IMAGING</title><date>2020-02-26</date><risdate>2020</risdate><abstract>The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information maybe used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre ; ger |
| recordid | cdi_epo_espacenet_EP3612095A1 |
| source | esp@cenet |
| subjects | DETECTING MASSES OR OBJECTS DIAGNOSIS GEOPHYSICS GRAVITATIONAL MEASUREMENTS HUMAN NECESSITIES HYGIENE IDENTIFICATION MEASURING MEDICAL OR VETERINARY SCIENCE PHYSICS SURGERY TESTING |
| title | BEAM HARDENING CORRECTION IN X-RAY DARK-FIELD IMAGING |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T23%3A01%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KOEHLER,%20Thomas&rft.date=2020-02-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3612095A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |