BEAM HARDENING CORRECTION IN X-RAY DARK-FIELD IMAGING

BEAM HARDENING CORRECTION IN X-RAY DARK-FIELD IMAGING

The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imag...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: KOEHLER, Thomas, DE MARCO, Fabio, YAROSHENKO, Andriy, MAACK, Hanns-Ingo, NOEL, Peter, WILLER, Konstantin, GROMANN, Lukas, Benedict
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
DETECTING MASSES OR OBJECTS
DIAGNOSIS
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
HUMAN NECESSITIES
HYGIENE
IDENTIFICATION
MEASURING
MEDICAL OR VETERINARY SCIENCE
PHYSICS
SURGERY
TESTING
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Beschreibung
Zusammenfassung:The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information maybe used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging.