TOPOGRAM-BASED FAT QUANTIFICATION FOR A COMPUTED TOMOGRAPHY EXAMINATION
In one aspect the invention relates to a method for calculating an examination parameter for a computed tomography examination of an area of interest of a patient, comprising:- Receiving a topogram of the area of interest of the patient,- Determining fat distribution information by applying a traine...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | In one aspect the invention relates to a method for calculating an examination parameter for a computed tomography examination of an area of interest of a patient, comprising:- Receiving a topogram of the area of interest of the patient,- Determining fat distribution information by applying a trained machine learning algorithm onto the topogram,- Calculating the examination parameter for the computed tomography examination of the area of interest of the patient based on the fat distribution information. |
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