TOPOGRAM-BASED FAT QUANTIFICATION FOR A COMPUTED TOMOGRAPHY EXAMINATION

In one aspect the invention relates to a method for calculating an examination parameter for a computed tomography examination of an area of interest of a patient, comprising:- Receiving a topogram of the area of interest of the patient,- Determining fat distribution information by applying a traine...

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Bibliographische Detailangaben
Hauptverfasser: Schmidt, Bernhard, Flohr, Thomas, Grasruck, Michael
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:In one aspect the invention relates to a method for calculating an examination parameter for a computed tomography examination of an area of interest of a patient, comprising:- Receiving a topogram of the area of interest of the patient,- Determining fat distribution information by applying a trained machine learning algorithm onto the topogram,- Calculating the examination parameter for the computed tomography examination of the area of interest of the patient based on the fat distribution information.