PIXEL-DESIGN FOR USE IN A RADIATION DETECTOR

PIXEL-DESIGN FOR USE IN A RADIATION DETECTOR

The present approach relates to the use of reference pixels provided between the primary pixels of a detector panel. Coincidence circuitry or logic may be employed so that the measured signal arising from the same X-ray event may be properly, that is the signal measured at both a reference and prima...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: JIN, Yannan, YANOFF, Brian David, FU, Geng, GUO, Jianjun, RUI, Xue, EDIC, Peter Michael
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:The present approach relates to the use of reference pixels provided between the primary pixels of a detector panel. Coincidence circuitry or logic may be employed so that the measured signal arising from the same X-ray event may be properly, that is the signal measured at both a reference and primary pixel may be combined so as to provide an accurate estimate of the measured signal, at an appropriate location on the detector panel.