INTEGRATED CIRCUIT WITH CONNECTIVITY ERROR DETECTION

INTEGRATED CIRCUIT WITH CONNECTIVITY ERROR DETECTION

An integrated circuit with transmission line error detection comprises a substrate (202), a package (218) enclosing the substrate, a lead (212) extending from the inside of the package to the outside of the package, and a circuit supported by the substrate. The circuit includes an input circuit (224...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Rigoni, Nicolas, Bernier, Brian, Cesaretti, Juan Manuel
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:An integrated circuit with transmission line error detection comprises a substrate (202), a package (218) enclosing the substrate, a lead (212) extending from the inside of the package to the outside of the package, and a circuit supported by the substrate. The circuit includes an input circuit (224) and an output circuit (204). A first wire (217) is coupled between the output circuit and the lead and a second wire (228) is coupled between the lead and the input circuit so that the input circuit receives a signal generated by the output circuit after the signal has been transmitted across the first and second wires.