MEASUREMENT SETUP, REFERENCE REFLECTOR AS WELL AS METHOD FOR MEASURING ATTENUATION

A measurement setup (10) for measuring attenuation through an irregular surface of a device under test (32) is described. The measurement setup (10) comprises a positioning system (14), a reference reflector (22) having a collection of diffuse scattering members (26), and a three dimensional imaging...

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Bibliographische Detailangaben
Hauptverfasser:	FISCHER, Thomas, GUMBMANN, Frank, FREISSL, Michael, KÖPPEL, Tobias, EVERS, Christian, AHMED, Sherif Sayed
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ANALOGOUS ARRANGEMENTS USING OTHER WAVES ANTENNAS, i.e. RADIO AERIALS BASIC ELECTRIC ELEMENTS DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES ELECTRICITY LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS RADIO DIRECTION-FINDING RADIO NAVIGATION TESTING
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Beschreibung
Zusammenfassung:	A measurement setup (10) for measuring attenuation through an irregular surface of a device under test (32) is described. The measurement setup (10) comprises a positioning system (14), a reference reflector (22) having a collection of diffuse scattering members (26), and a three dimensional imaging system (12). The measurement setup (10) has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system (12) is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test (32). Further, a reference reflector (22) as well as a method for measuring attenuation are described.