SPECTROMETER, ANALYSIS EQUIPMENT, AND WAVELENGTH-VARIABLE LIGHT SOURCE

SPECTROMETER, ANALYSIS EQUIPMENT, AND WAVELENGTH-VARIABLE LIGHT SOURCE

(Object) To enable to provide a small-scale and low-cost spectrometer (Means of Achieving the Object) A spectrometer includes: a light incidence unit configured to allow incidence of light from outside; a diffraction grating configured to disperse, according to wavelength, the light that is incident...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NOGUCHI, Hidetaka, AZUMI, Junichi, SUEMATSU, Masashi, KATO, Hidenori, SUZUKI, Shuichi, FUJISHIMA, Masayuki
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:(Object) To enable to provide a small-scale and low-cost spectrometer (Means of Achieving the Object) A spectrometer includes: a light incidence unit configured to allow incidence of light from outside; a diffraction grating configured to disperse, according to wavelength, the light that is incident through the light incidence unit; and a reflection unit including a reflection surface for reflecting the light that has been dispersed according to wavelength by the diffraction grating. Tilt of the reflection surface is changeable.