MEASURING DEVICE, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM

The present invention provides a measurement apparatus characterized by comprising: a measurement unit configured to measure a reflection characteristic of a surface; an image capturing unit configured to, by image-capturing a measurement region on the surface on which the reflection characteristic is measured by the measurement unit, obtain an image of the measurement region; and a control unit configured to cause a display unit to display a plurality of measurement results obtained by a plurality of times of measurement by the measurement unit, wherein the control unit causes the display unit to display the image obtained by the image capturing unit which corresponds to a measurement result selected from the plurality of measurement results, together with the plurality of measurement results.