MEASURING DEVICE, INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM

The present invention provides a measurement apparatus characterized by comprising: an irradiation unit configured to obliquely irradiate a surface with light; a detection unit configured to detect an intensity distribution of reflected light from the surface; a processing unit configured to obtain a two-dimensional BRDF of the surface based on the intensity distribution; and a display unit configured to display the BRDF obtained by the processing unit, wherein the detection unit detects the intensity distribution in a direction range that includes a first direction as a direction of specular light from the surface and does not include a direction that defines, together with the first direction, an angle not less than an angle defined by the first direction and a second direction orthogonal to the surface.