OPTO-ELECTRONIC MEASURING DEVICE WITH SCAN FUNCTIONALITY
An optoelectronic measuring device having scanning functionality having a pulsed radiation source for generating a measuring beam from light pulses at a light pulse emission rate, an optoelectronic detector for detecting light pulses reflected from a target object, a control and analysis unit design...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | An optoelectronic measuring device having scanning functionality having a pulsed radiation source for generating a measuring beam from light pulses at a light pulse emission rate, an optoelectronic detector for detecting light pulses reflected from a target object, a control and analysis unit designed for measuring a distance value from a respective scanning point of the target object according to the time-of-flight principle, based on a number n>=1 of light pulses, wherein the control and analysis unit is designed to automatically set the number (n) depending on a target-object-related measured value determined by the measuring device in real time. |
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