MEASURING METHOD AND MEASURING SYSTEM

[Problem] To provide a measuring method and a measuring system capable of improving accuracy of measurement.[Solution] The measuring method is a measuring method of measuring a measurement target contained in a sample, including a pass-through step of passing a complex 78, formed by allowing the mea...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: OKA, Akihiro, MATSUNO, Tatsuki, HIKI, Shinichiro
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:[Problem] To provide a measuring method and a measuring system capable of improving accuracy of measurement.[Solution] The measuring method is a measuring method of measuring a measurement target contained in a sample, including a pass-through step of passing a complex 78, formed by allowing the measurement target to react with a predetermined carrier, through a pore 41 provided in a substrate 40 by electrophoresis, etc., a measuring step of measuring a size of the complex 78 based on change in electrical characteristics occurring when the complex 78 is passed through the pore 41 in the pass-through step, and an determining step of determining the number of measurement targets based on the size of the complex 78 measured in the measuring step.