METHODS AND APPARATUS FOR CONSTRUCTING A PARAMETERIZED GEOMETRIC MODEL OF A STRUCTURE AND ASSOCIATED INSPECTION APPARATUS AND METHOD

METHODS AND APPARATUS FOR CONSTRUCTING A PARAMETERIZED GEOMETRIC MODEL OF A STRUCTURE AND ASSOCIATED INSPECTION APPARATUS AND METHOD

Disclosed is a method for constructing a parameterized geometric model of a structure, and an associated inspection apparatus. The method comprises determining an initial contour defining a modeled surface of the structure; and determining an output contour defining the modeled surface of the struct...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: DIRKS, Remco, VAN LAARHOVEN, Hendrik, Adriaan, BUIJNSTERS, Frank, Jaco
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
APPARATUS SPECIALLY ADAPTED THEREFOR
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
MATERIALS THEREFOR
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Disclosed is a method for constructing a parameterized geometric model of a structure, and an associated inspection apparatus. The method comprises determining an initial contour defining a modeled surface of the structure; and determining an output contour defining the modeled surface of the structure as a Minkowski sum of the initial contour and a kernel.