RESISTANCE CALIBRATION

The present invention relates to resistance calibration and in particular to resistance calibration in the context of semiconductor integrated circuitry.

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Bibliographische Detailangaben
Hauptverfasser:	DESUMVILA, Salvador, SHAFEEU, Hassan
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRONIC CIRCUITRY ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION
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Beschreibung
Zusammenfassung:	The present invention relates to resistance calibration and in particular to resistance calibration in the context of semiconductor integrated circuitry.