INFORMATION PROCESSING SYSTEM, METHOD OF INFORMATION PROCESSING, AND PROGRAM

INFORMATION PROCESSING SYSTEM, METHOD OF INFORMATION PROCESSING, AND PROGRAM

There is provided an information processing apparatus including: circuitry configured to detect a three-dimensional (3D) object and a distance from a surface of the 3D object to a reference position, wherein the surface of the 3D object is located between the reference position and a sensor that is...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: IKEDA, Tetsuo, NAGANO, Kae
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:There is provided an information processing apparatus including: circuitry configured to detect a three-dimensional (3D) object and a distance from a surface of the 3D object to a reference position, wherein the surface of the 3D object is located between the reference position and a sensor that is used to detect the distance, determine an image corresponding to the detected 3D object and the detected distance from the surface of the 3D object to the reference position, and control a displaying of the determined image upon the surface of the 3D object.