SYSTEM AND METHOD FOR TESTING A MATERIAL SYSTEM

A system and method for testing a material system may include a support structure for mounting the material system, and a electromechanical device operably connected to the support structure, wherein the electromechanical device applies an electromechanical-induced force to the material system, and...

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Bibliographische Detailangaben
Hauptverfasser: MORGAN, Jeffrey D, LE, Quynhgiao N, DREXLER, Julie M, GREEGOR, Robert B, MITTLEIDER, John A
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:A system and method for testing a material system may include a support structure for mounting the material system, and a electromechanical device operably connected to the support structure, wherein the electromechanical device applies an electromechanical-induced force to the material system, and wherein the electromechanical-induced force causes a displacement in the material system equivalent to material displacement from thermal stress in significantly less time.