IMPROVED SIMS SPECTROMETRY TECHNIQUE USING FLUORINE CATALYSIS
A method of performing Secondary Ion Mass Spectrometry, comprising: - Providing a specimen on a specimen holder; - Using an ion beam to irradiate a region of a surface of said specimen, thereby producing ablated specimen material; - Collecting ionized constituents of said ablated material in a mass...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | A method of performing Secondary Ion Mass Spectrometry, comprising:
- Providing a specimen on a specimen holder;
- Using an ion beam to irradiate a region of a surface of said specimen, thereby producing ablated specimen material;
- Collecting ionized constituents of said ablated material in a mass analyzer, and sorting them according to species,
further comprising:
- Providing a catalytic gas proximal said region of the specimen surface during said irradiation, said gas comprising fluorine atoms.
Said catalytic gas may, for example, comprise a gas-phase hydrocarbon in which at least some hydrogen atoms have been substituted by fluorine atoms, e.g. a perfluoroalkane. |
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