INFRARED DEVICE

An infrared device comprises a substrate (1). A configuration (3) for one of absorbing and emitting infrared radiation is supported by the substrate (1). The configuration (3) comprises an electrically conducting layer arrangement (31) of less than 50 nm thickness between dielectric layers (34,35)....

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Bibliographische Detailangaben
Hauptverfasser:	Zäch, Nicolas, Winger, Martin
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS COLORIMETRY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	An infrared device comprises a substrate (1). A configuration (3) for one of absorbing and emitting infrared radiation is supported by the substrate (1). The configuration (3) comprises an electrically conducting layer arrangement (31) of less than 50 nm thickness between dielectric layers (34,35). In addition, one or more of a thermal sensor (5) arranged for sensing the infrared radiation absorbed by the configuration (3), and a heater (7) arranged for heating the configuration (3) to emit the infrared radiation is supported by the substrate (1)