SURVEYING INSTRUMENT FOR SCANNING AN OBJECT AND FOR PROJECTION OF INFORMATION
Surveying device (1) comprising a base (2) which defines a base axis (A), a support structure (3) which is arranged to be rotatable around the base axis (A) and which defines a rotation axis (B), a light emitting unit for emitting measuring signal (5) and a light receiving unit comprising a detector...
Gespeichert in:
Hauptverfasser: | , , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Surveying device (1) comprising a base (2) which defines a base axis (A), a support structure (3) which is arranged to be rotatable around the base axis (A) and which defines a rotation axis (B), a light emitting unit for emitting measuring signal (5) and a light receiving unit comprising a detector for detecting reflected measuring signal (5). A rotation unit (10) is mounted on the support structure (3) for providing emission and reception of measuring light (5) in defined directions, wherein the rotation unit (10) comprises a rotation body (11) which is mounted rotatable around the rotation axis (B) and the rotation body (11) comprises a scanning mirror (12) which is arranged tilted relative to the rotation axis (B). The device comprises at least one projector (15) fixedly arranged with the support structure (3), defining a particular optical axis and configured to direct a light pattern at a scene, wherein position and shape of the pattern are controllable by the controlling and processing unit. The rotation body (11) comprises at least one deflecting surface (13), and the at least one projector (15) and the rotation body (11) are designed so and arranged relative to each other so that in a predetermined range of alignment of the rotation body the optical axis of the at least one projector is deflected by the at least one deflecting surface (13), a field of view of the at least one projector (15) is deflected and defined by the deflection of the optical axis so that the field of view comprises a defined field angle around the rotation axis (B) and basically parallax-free light pattern projection is providable with the surveying device (1). |
---|