IMPROVED SELF-ASSEMBLED MONOLAYER BLOCKING WITH INTERMITTENT AIR-WATER EXPOSURE

Implementations described herein generally relate to processes for the fabrication of semiconductor devices in which a self-assembled monolayer (SAM) is used to achieve selective area deposition. Methods described herein relate to SAM molecule and hydroxyl moiety exposure operations which may be uti...

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Bibliographische Detailangaben
Hauptverfasser: WONG, Keith Tatseun, KAUFMAN-OSBORN, Tobin
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:Implementations described herein generally relate to processes for the fabrication of semiconductor devices in which a self-assembled monolayer (SAM) is used to achieve selective area deposition. Methods described herein relate to SAM molecule and hydroxyl moiety exposure operations which may be utilized to form SAM layers suitable for blocking deposition of subsequently deposited materials.