QUANTITATIVE NON-LINEAR OPTICAL MICROSCOPE
The invention relates to a non-linear optical microscope (12) comprising a Bessel excitation laser beam source (28) for exciting a sample (16) under test, a detector (36) for detecting the coherent signals emitted in transmission by the sample (16) under test in response to the excitation by the exc...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | The invention relates to a non-linear optical microscope (12) comprising a Bessel excitation laser beam source (28) for exciting a sample (16) under test, a detector (36) for detecting the coherent signals emitted in transmission by the sample (16) under test in response to the excitation by the excitation laser beam, and a filter (38) placed between the sample (16) under test and the detector (36) to prevent the detector (36) from detecting the signals emitted in transmission by the sample (16) under test, said filter (38) extending near the optical axis (Z) of the microscope. The invention also relates to a slide scanner (10) comprising a non-linear optical microscope (12) of said type, a non-linear microscopy method, and a slide scanning method that can be carried out in a microscope (12) and a scanner (10) of said type. |
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