INTERFEROMETER FOR SUPERRESOLVED RAMAN MICROSCOPY

A Raman microscope system for characterizing a sample of interest, the Raman microscope system comprising an excitation unit for inducing Raman scattering at a sample plane and a Raman scattering detection unit for detecting Raman scattering from the sample. The excitation unit comprises a beam spli...

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Bibliographische Detailangaben
Hauptverfasser:	KUMAR, Saurav, LE THOMAS, Nicolas, KHALENKOW, Dmitry, DIAZ TORMO, Alejandro, SKIRTACH, Andre
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	A Raman microscope system for characterizing a sample of interest, the Raman microscope system comprising an excitation unit for inducing Raman scattering at a sample plane and a Raman scattering detection unit for detecting Raman scattering from the sample. The excitation unit comprises a beam splitter for splitting a radiation pump beam into two coherent pump beams, optical elements for guiding the two pump beams along two optical paths towards the sample plane so as to form two counter-propagating pump beams at the sample plane forming an interference pattern at the sample plane for inducing Raman scattering and a phase difference detection scheme for detecting a phase difference occurring at the sample plane from none-blocked parts of the two counter-propagating pump beams after their passage at the sample plane.