QUALITY MANAGEMENT SYSTEMS, METHODS, AND PROGRAM PRODUCTS FOR ADDITIVE MANUFACTURING SUPPLY CHAINS

Additive Manufacturing Quality Management (AMQM) systems (10) and methods (60) are provided, which enhance quality control across Additive Manufacturing (AM) supply chains from which AM components are obtained. In various embodiments, the AMQM system includes an AM machine (20) utilized to produce A...

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Bibliographische Detailangaben
Hauptverfasser:	GODFREY, Donald G, BAUGHMAN, Brian G, KALYANDURG, Niranjan, WIENER, Soeren
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ADDITIVE MANUFACTURING TECHNOLOGY ADDITIVE MANUFACTURING, i.e. MANUFACTURING OFTHREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVEAGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING,STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PERFORMING OPERATIONS PHYSICS REGULATING SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR SHAPING OR JOINING OF PLASTICS TRANSPORTING WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
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Zusammenfassung:	Additive Manufacturing Quality Management (AMQM) systems (10) and methods (60) are provided, which enhance quality control across Additive Manufacturing (AM) supply chains from which AM components are obtained. In various embodiments, the AMQM system includes an AM machine (20) utilized to produce AM components (40) in accordance with AM design data (34). A first sensor (42) is coupled to the AM machine and, during fabrication of AM components (40) by the AM machine (20), captures sensor readings pertaining to the AM fabrication process. When executed by a processor (44), computer-executable code causes the AMQM system to: (i) compile part-specific sensor profiles (110, 112, 114) from sensor readings captured by the first sensor (42) during fabrication of the AM components (40), and (ii) generate user notifications indicating whether remedial action should be performed for any of the AM components (40) based, at least in part, on conformance of the part-specific sensor profiles (110, 112, 114) with a baseline sensor (42) profile corresponding to the AM design data (34).