CONTACTOR SOCKET AND IC TEST HANDLER

Contactor socket of an IC test handler, the contactor socket comprising a contactor socket body (50) having a first (51a) and second (52a) plane surface, the second plane surface being parallel and opposite to the first plane surface, and a line or an array of test contacts (54) supported within the contactor socket body, extending normal to the and between the first and second plane surface and adapted for providing elastic pressure contact with IC device contacts of a plurality of ICs which are positioned on the first plane surface and/or with test device contacts of a test device positioned on the second plane surface and, thus, an electrical connection between the IC device contacts and test device contacts, wherein the first (51) and/or second body portion (52) comprises a line or an array of individual spring-loaded supports for holding each of the test contacts of the line or array in elastic pre-tension towards the first and second plane surface, wherein the contactor socket body comprises a first and second body portion, the first body portion defining the first plane surface and the second body portion defining the second plane surface, the first and second body portions being connected to each other such that they are movable relative to each other in a direction normal to the first and second plane surfaces, and socket body pre-biasing means (53) for biasing the first body portion against the second body portion normal to the first and second plane surfaces and, herewith, to provide additional spring stroke to the stroke provided by the individual spring-loaded test contact supports are provided.