SPECTRUM MEASUREMENT METHOD USING FOURIER-TRANSFORM-TYPE SPECTROMETER

A spectrum measurement method comprising applying a Fourier transform to an interferogram of infrared interference waves acquired using an interferometer, the spectrum measurement method including a step for oversampling intensity signals of infrared interference waves at each position (D1, D1, ...)...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: SUNAMI, Testuji, WAKIMOTO, Norio, SHIMAMURA, Takashi, KOSHOBU, Jun
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A spectrum measurement method comprising applying a Fourier transform to an interferogram of infrared interference waves acquired using an interferometer, the spectrum measurement method including a step for oversampling intensity signals of infrared interference waves at each position (D1, D1, ...) of a movable mirror using the wavelength »1 of a semiconductor laser as a reference, and a step for inserting intensity signals (I1', I2', ...) that would be obtained in the case of sampling infrared interference waves at each position (D1', D2', ...) of the movable mirror using the wavelength »0 of an He-Ne laser as a reference using the intensity signals (11, 12, ...) ac - quired by the oversampling, and the spectrum measurement method being capable of effectively utilizing existing spectral data and the like measured using the wavelength »0 by calculating a spectrum from an interferogram based on the inserted intensity signals.