SYSTEMS FOR IMPROVING IMAGING BY SUB-PIXEL CALIBRATION

A radiation detector assembly 100 is provided that includes a semiconductor detector 110 having a surface 112, plural pixelated anodes 114, and at least one processor 120. The pixelated anodes 114 are disposed on the surface 112. Each pixelated anode 114 is configured to generate a primary signal responsive to reception of a photon by the pixelated anode 114a and to generate at least one secondary signal responsive to an induced charge caused by reception of a photon by at least one adjacent anode 114b. The at least one processor 120 is operably coupled to the pixelated anodes 114. The at least one processor 120 configured to define sub-pixels for each pixelated anode 1302; acquire signals corresponding to acquisition events from the pixelated anodes 1304; determine sub-pixel locations for the acquisition events using the signals 1306; and apply at least one calibration parameter on a per sub-pixel basis for the acquisition events based on the determined sub-pixel locations 1308.