IMPROVED SPECTROSCOPIC DEVICE AND METHOD FOR SAMPLE CHARACTERIZATION

The invention relates to a characterization device (50) for characterizing a sample (S) comprising: - a memory (MEM) storing a mesured spectrum (A s+p ) of said sample, performed through a translucent material, and a measured spectrum of the translucent material (A p ), - a processing unit (PU) conf...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	BOULANGER, Anthony, BOURDEAU, Aude, LABORDE, Antoine
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	The invention relates to a characterization device (50) for characterizing a sample (S) comprising: - a memory (MEM) storing a mesured spectrum (A s+p ) of said sample, performed through a translucent material, and a measured spectrum of the translucent material (A p ), - a processing unit (PU) configured to: * determine a spectral energy (E s+p ) of the measured spectrum (A s+p ) of the sample through the translucent material (A s+p ), * estimate a coefficient ( ³ ) from said spectral energy (E s+p ) and, * determine a corrected spectrum (A s ) of the sample from the measured spectrum (A s+p ) of the sample through the translucent material and from a corrected spectrum of the translucent material (A p ), said corrected spectrum of the translucent material (A p ) being determined from the measured spectrum of the translucent material (A p ) and from the estimated coefficient ( ³ ).