FULL-FIELD OCT SYSTEM USING WAVELENGTH-TUNABLE LASER AND THREE-DIMENSIONAL IMAGE CORRECTION METHOD

The present disclosure provides a full-field OCT system using a wavelength-tunable laser, which can observe peaks of a short-time A-line profile corresponding to each time point at which interference images of an object to be measured are acquired, so as to measure a depth direction movement of the...

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Bibliographische Detailangaben
Hauptverfasser:	KIM, Chang Soo, LEE, Hyun Ki, YOO, Hong Ki, NAM, Hyeong Soo
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	DIAGNOSIS HUMAN NECESSITIES HYGIENE IDENTIFICATION INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEDICAL OR VETERINARY SCIENCE PHYSICS SURGERY TESTING
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Beschreibung
Zusammenfassung:	The present disclosure provides a full-field OCT system using a wavelength-tunable laser, which can observe peaks of a short-time A-line profile corresponding to each time point at which interference images of an object to be measured are acquired, so as to measure a depth direction movement of the object to be measured, and can correct the phases of interference signals on the basis of the measured depth direction movement, so as to generate an OCT image which is compensated for the depth direction movement.