INDEX OF REFRACTION SENSOR SYSTEM WITH DUAL MODE TEMPERATURE CONTROL

INDEX OF REFRACTION SENSOR SYSTEM WITH DUAL MODE TEMPERATURE CONTROL

A sensor system (100) utilizes temperature control systems (262) and methods to achieve and maintain a sample in a sample chamber (110) at a sampling temperature. Such sensor systems and methods may employ a dual mode temperature controller including a spike mode (SMC) controller (274) and a proport...

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Bibliographische Detailangaben
1. Verfasser: BALCHUNAS, John Anthony
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Zusammenfassung:A sensor system (100) utilizes temperature control systems (262) and methods to achieve and maintain a sample in a sample chamber (110) at a sampling temperature. Such sensor systems and methods may employ a dual mode temperature controller including a spike mode (SMC) controller (274) and a proportional-integral-derivative (PID) mode controller (272). Based on a temperature of the sample, the temperature controller of the sensor system can initially enter the spike mode or the PID mode.