ELECTRON BEAM GENERATION FOR TRANSMISSION ELECTRON MICROSCOPE
The present invention provides a device for generating an electron beam, the device comprising: a pulsed electron source configured to generate an electron pulse; a first resonant microwave cavity configured to accelerate the electron pulse; a second resonant microwave cavity configured to correct a...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | The present invention provides a device for generating an electron beam, the device comprising: a pulsed electron source configured to generate an electron pulse; a first resonant microwave cavity configured to accelerate the electron pulse; a second resonant microwave cavity configured to correct an energy spread of the accelerated electron pulse; a drift space separating the first resonant microwave cavity from the second resonant microwave cavity; and a phase shifter connected to the first resonant microwave cavity and the second resonant microwave cavity, configured to adjust an RF phase difference between the first resonant microwave cavity and the second resonant microwave cavity to a value substantially equal to 90 degrees. |
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