MICRO-SPECTROMETRY MEASUREMENT METHOD AND SYSTEM
The invention concerns an optical micro-spectrometry system comprising an optical microscope (10), a spectrometry system (50) and an optical system (14) adapted to direct an excitation light beam on the sample through said at least one microscope objective (11, 12) and to collect a Raman or PL light...
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| creator | Kokota, Alexandre Marchessoux, Cédric Shynkar, Vasyl |
| description | The invention concerns an optical micro-spectrometry system comprising an optical microscope (10), a spectrometry system (50) and an optical system (14) adapted to direct an excitation light beam on the sample through said at least one microscope objective (11, 12) and to collect a Raman or PL light beam from a sample. According to the invention, the optical micro-spectrometry system comprises an imaging system (16, 41) configured for acquiring a first image (71) and a second image (72) of the sample, by reflection or transmission of an illumination beam from a sample surface, the first image (71) having a large field of view and the second image (72) having a small field of view, a processing system (40) configured for determining an area in the first image (71) corresponding to the second image (72), a display system (44) configured for displaying the first image (71), the second image (72), and a third image (73) representing said area in overlay on the first image (71). |
| format | Patent |
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According to the invention, the optical micro-spectrometry system comprises an imaging system (16, 41) configured for acquiring a first image (71) and a second image (72) of the sample, by reflection or transmission of an illumination beam from a sample surface, the first image (71) having a large field of view and the second image (72) having a small field of view, a processing system (40) configured for determining an area in the first image (71) corresponding to the second image (72), a display system (44) configured for displaying the first image (71), the second image (72), and a third image (73) representing said area in overlay on the first image (71).</description><language>eng ; fre ; ger</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20191023&DB=EPODOC&CC=EP&NR=3351992B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25555,76308</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20191023&DB=EPODOC&CC=EP&NR=3351992B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Kokota, Alexandre</creatorcontrib><creatorcontrib>Marchessoux, Cédric</creatorcontrib><creatorcontrib>Shynkar, Vasyl</creatorcontrib><title>MICRO-SPECTROMETRY MEASUREMENT METHOD AND SYSTEM</title><description>The invention concerns an optical micro-spectrometry system comprising an optical microscope (10), a spectrometry system (50) and an optical system (14) adapted to direct an excitation light beam on the sample through said at least one microscope objective (11, 12) and to collect a Raman or PL light beam from a sample. According to the invention, the optical micro-spectrometry system comprises an imaging system (16, 41) configured for acquiring a first image (71) and a second image (72) of the sample, by reflection or transmission of an illumination beam from a sample surface, the first image (71) having a large field of view and the second image (72) having a small field of view, a processing system (40) configured for determining an area in the first image (71) corresponding to the second image (72), a display system (44) configured for displaying the first image (71), the second image (72), and a third image (73) representing said area in overlay on the first image (71).</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDw9XQO8tcNDnB1Dgny93UNCYpU8HV1DA4NcvV19QsBskM8_F0UHP1cFIIjg0NcfXkYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSbxrgLGxqaGlpZGToTERSgAWWSZY</recordid><startdate>20191023</startdate><enddate>20191023</enddate><creator>Kokota, Alexandre</creator><creator>Marchessoux, Cédric</creator><creator>Shynkar, Vasyl</creator><scope>EVB</scope></search><sort><creationdate>20191023</creationdate><title>MICRO-SPECTROMETRY MEASUREMENT METHOD AND SYSTEM</title><author>Kokota, Alexandre ; Marchessoux, Cédric ; Shynkar, Vasyl</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3351992B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2019</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Kokota, Alexandre</creatorcontrib><creatorcontrib>Marchessoux, Cédric</creatorcontrib><creatorcontrib>Shynkar, Vasyl</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kokota, Alexandre</au><au>Marchessoux, Cédric</au><au>Shynkar, Vasyl</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MICRO-SPECTROMETRY MEASUREMENT METHOD AND SYSTEM</title><date>2019-10-23</date><risdate>2019</risdate><abstract>The invention concerns an optical micro-spectrometry system comprising an optical microscope (10), a spectrometry system (50) and an optical system (14) adapted to direct an excitation light beam on the sample through said at least one microscope objective (11, 12) and to collect a Raman or PL light beam from a sample. According to the invention, the optical micro-spectrometry system comprises an imaging system (16, 41) configured for acquiring a first image (71) and a second image (72) of the sample, by reflection or transmission of an illumination beam from a sample surface, the first image (71) having a large field of view and the second image (72) having a small field of view, a processing system (40) configured for determining an area in the first image (71) corresponding to the second image (72), a display system (44) configured for displaying the first image (71), the second image (72), and a third image (73) representing said area in overlay on the first image (71).</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre ; ger |
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| subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TESTING |
| title | MICRO-SPECTROMETRY MEASUREMENT METHOD AND SYSTEM |
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