PHOTORESIST CLEANING COMPOSITION USED IN PHOTOLITHOGRAPHY AND A METHOD FOR TREATING SUBSTRATE THEREWITH

It is disclosed a photoresist cleaning composition for stripping a photoresist pattern having a film thickness of 3-150 μm, which contains (a) quaternary ammonium hydroxide (b) a mixture of water-soluble organic solvents (c) at least one corrosion inhibitor and (d) water, and a method for treating a...

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Bibliographische Detailangaben
Hauptverfasser: CHEN, Hsiu, Mei, LO, Ryback, Li Chang, CHEN, Tianniu, MENG, Ling-Jen, CHANG, Randy, Li-Kai, PARRIS, Gene, Everad, MATZ, Laura, M, LIU, Wen, Dar, LEE, Yi-chia
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:It is disclosed a photoresist cleaning composition for stripping a photoresist pattern having a film thickness of 3-150 μm, which contains (a) quaternary ammonium hydroxide (b) a mixture of water-soluble organic solvents (c) at least one corrosion inhibitor and (d) water, and a method for treating a substrate therewith.