SENSOR FOR NON-DESTRUCTIVE CHARACTERIZATION OF OBJECTS

The present invention relates to a millimeter or terahertz wave sensor for providing inline inspection, preferably including but not limited to continuous monitoring of objects, for example thin sheet dielectric material.

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Bibliographische Detailangaben
Hauptverfasser:	DEFERM, Noël, REDANT, Tom, REYNAERT, Patrick, DEHAENE, Wim
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present invention relates to a millimeter or terahertz wave sensor for providing inline inspection, preferably including but not limited to continuous monitoring of objects, for example thin sheet dielectric material.