SPECIMEN ANALYSIS APPARATUS, AND MEASUREMENT METHOD THEREOF

A specimen analysis apparatus and measurement method thereof are provided. The specimen analysis apparatus includes: a cartridge including at least two containers, at least one of the at least two containers containing an internal standard material including a target material; and a controller confi...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Hwang, Kyu Youn, Lee, Hae Seok, Shin, Sung Chul, Lee, Sang Hyun, Park, Jong Myeon
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A specimen analysis apparatus and measurement method thereof are provided. The specimen analysis apparatus includes: a cartridge including at least two containers, at least one of the at least two containers containing an internal standard material including a target material; and a controller configured to determine a correction value for a concentration of the target material by comparing an extent of a change in optical signal values of the target material measured in the at least two containers with a predetermined extent of change in the optical signal values of the target material..