DEVICE AND METHOD FOR MAPPING FERROELECTRIC AND/OR PIEZOELECTRIC SAMPLES

The present invention is related to a new direct piezoelectric force microscope (1) and the method for imaging and/or characterizing ferroelectric and/or piezoelectric samples using the direct piezoelectric force microscope (1). This device and this method obtain a direct quantitative measurement of...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	OBRADORS BERENGUER, Francesc Xavier, PUIG MOLINA, María Teresa, CARRETERO GENEVRIER, Adrien, GÓMEZ RODRÍGUEZ, Andrés, GICH GARCÍA, Marti
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The present invention is related to a new direct piezoelectric force microscope (1) and the method for imaging and/or characterizing ferroelectric and/or piezoelectric samples using the direct piezoelectric force microscope (1). This device and this method obtain a direct quantitative measurement of the piezoelectric constant in piezoelectric and/or ferroelectrics samples by using amplifier means (5) and a probe that comprises a tip (3) which is adapted to discharge all the superficial charge and strain a piezoelectric material in order to collect the charge build up by the direct piezoelectric effect.