METHODS, SYSTEMS AND DEVICES FOR AUTOMATICALLY FOCUSING A MICROSCOPE ON A SUBSTRATE

Methods, systems and devices for automatically focusing a microscope on a specimen and collecting a focused image of the specimen are provided. Aspects of the methods include detecting the presence of a substrate in a microscope, determining whether the substrate is in a correct orientation for imag...

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Hauptverfasser:	BEREZHNA, Svitlana Y, CHACKO, Koshy Thekkadathu, SHIELDS, Trevor David, JANBAKHSH, Mahmoud, VERDNIK, Damian John, FAHEY, Robert John
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING
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creator	BEREZHNA, Svitlana Y CHACKO, Koshy Thekkadathu SHIELDS, Trevor David JANBAKHSH, Mahmoud VERDNIK, Damian John FAHEY, Robert John
description	Methods, systems and devices for automatically focusing a microscope on a specimen and collecting a focused image of the specimen are provided. Aspects of the methods include detecting the presence of a substrate in a microscope, determining whether the substrate is in a correct orientation for imaging, focusing the microscope on a specimen that is placed on the substrate, and collecting one or more images of the specimen. Systems and devices for carrying out the subject methods are also provided.
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subjects	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING
title	METHODS, SYSTEMS AND DEVICES FOR AUTOMATICALLY FOCUSING A MICROSCOPE ON A SUBSTRATE
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