METHODS, SYSTEMS AND DEVICES FOR AUTOMATICALLY FOCUSING A MICROSCOPE ON A SUBSTRATE

METHODS, SYSTEMS AND DEVICES FOR AUTOMATICALLY FOCUSING A MICROSCOPE ON A SUBSTRATE

Methods, systems and devices for automatically focusing a microscope on a specimen and collecting a focused image of the specimen are provided. Aspects of the methods include detecting the presence of a substrate in a microscope, determining whether the substrate is in a correct orientation for imag...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: BEREZHNA, Svitlana Y, CHACKO, Koshy Thekkadathu, SHIELDS, Trevor David, JANBAKHSH, Mahmoud, VERDNIK, Damian John, FAHEY, Robert John
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Methods, systems and devices for automatically focusing a microscope on a specimen and collecting a focused image of the specimen are provided. Aspects of the methods include detecting the presence of a substrate in a microscope, determining whether the substrate is in a correct orientation for imaging, focusing the microscope on a specimen that is placed on the substrate, and collecting one or more images of the specimen. Systems and devices for carrying out the subject methods are also provided.