X-RAY SCATTERING APPARATUS
The invention relates to an X-ray scattering apparatus, comprising: - a sample holder for aligning and orienting a sample (12) to be analyzed by X-ray scattering; - an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagati...
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| creator | Høghøj, Peter |
| description | The invention relates to an X-ray scattering apparatus, comprising:
- a sample holder for aligning and orienting a sample (12) to be analyzed by X-ray scattering;
- an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction (X) towards the sample holder;
- a proximal X-ray detector (10) arranged downstream of the sample holder such as to let the direct X-ray beam pass and detect X rays scattered from the sample (12); and
- a distal X-ray detector (14)arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam; wherein the proximal X-ray detector (10) is also movable essentially along the propagation direction (X) of the direct X-ray beam. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3246695A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3246695A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3246695A13</originalsourceid><addsrcrecordid>eNrjZJCK0A1yjFQIdnYMCXEN8vRzV3AMCHAMcgwJDeZhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuAcZGJmZmlqaOhsZEKAEA_xMgBQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>X-RAY SCATTERING APPARATUS</title><source>esp@cenet</source><creator>Høghøj, Peter</creator><creatorcontrib>Høghøj, Peter</creatorcontrib><description>The invention relates to an X-ray scattering apparatus, comprising:
- a sample holder for aligning and orienting a sample (12) to be analyzed by X-ray scattering;
- an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction (X) towards the sample holder;
- a proximal X-ray detector (10) arranged downstream of the sample holder such as to let the direct X-ray beam pass and detect X rays scattered from the sample (12); and
- a distal X-ray detector (14)arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam; wherein the proximal X-ray detector (10) is also movable essentially along the propagation direction (X) of the direct X-ray beam.</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171122&DB=EPODOC&CC=EP&NR=3246695A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171122&DB=EPODOC&CC=EP&NR=3246695A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Høghøj, Peter</creatorcontrib><title>X-RAY SCATTERING APPARATUS</title><description>The invention relates to an X-ray scattering apparatus, comprising:
- a sample holder for aligning and orienting a sample (12) to be analyzed by X-ray scattering;
- an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction (X) towards the sample holder;
- a proximal X-ray detector (10) arranged downstream of the sample holder such as to let the direct X-ray beam pass and detect X rays scattered from the sample (12); and
- a distal X-ray detector (14)arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam; wherein the proximal X-ray detector (10) is also movable essentially along the propagation direction (X) of the direct X-ray beam.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJCK0A1yjFQIdnYMCXEN8vRzV3AMCHAMcgwJDeZhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuAcZGJmZmlqaOhsZEKAEA_xMgBQ</recordid><startdate>20171122</startdate><enddate>20171122</enddate><creator>Høghøj, Peter</creator><scope>EVB</scope></search><sort><creationdate>20171122</creationdate><title>X-RAY SCATTERING APPARATUS</title><author>Høghøj, Peter</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3246695A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2017</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Høghøj, Peter</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Høghøj, Peter</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>X-RAY SCATTERING APPARATUS</title><date>2017-11-22</date><risdate>2017</risdate><abstract>The invention relates to an X-ray scattering apparatus, comprising:
- a sample holder for aligning and orienting a sample (12) to be analyzed by X-ray scattering;
- an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction (X) towards the sample holder;
- a proximal X-ray detector (10) arranged downstream of the sample holder such as to let the direct X-ray beam pass and detect X rays scattered from the sample (12); and
- a distal X-ray detector (14)arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam; wherein the proximal X-ray detector (10) is also movable essentially along the propagation direction (X) of the direct X-ray beam.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre ; ger |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | X-RAY SCATTERING APPARATUS |
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