X-RAY SCATTERING APPARATUS
The invention relates to an X-ray scattering apparatus, comprising: - a sample holder for aligning and orienting a sample (12) to be analyzed by X-ray scattering; - an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagati...
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| Format: | Patent |
| Sprache: | eng ; fre ; ger |
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| Zusammenfassung: | The invention relates to an X-ray scattering apparatus, comprising:
- a sample holder for aligning and orienting a sample (12) to be analyzed by X-ray scattering;
- an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction (X) towards the sample holder;
- a proximal X-ray detector (10) arranged downstream of the sample holder such as to let the direct X-ray beam pass and detect X rays scattered from the sample (12); and
- a distal X-ray detector (14)arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam; wherein the proximal X-ray detector (10) is also movable essentially along the propagation direction (X) of the direct X-ray beam. |
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