APPARATUS AND METHOD FOR ANALYSING A SURFACE

Apparatus for analyzing a surface which, in use, is subject to drag, the apparatus comprising, a light source for generating light of at least one predetermined wavelength, a light source holder for holding and positioning the light source so as to direct it at the surface, a light detector for dete...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	KIELY, Janice Helen, LUXTON, Richard William, COSTELLO, Ben de Lacy, COX, Timothy Ingram, MIMMS, Graham Shaun
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	Apparatus for analyzing a surface which, in use, is subject to drag, the apparatus comprising, a light source for generating light of at least one predetermined wavelength, a light source holder for holding and positioning the light source so as to direct it at the surface, a light detector for detecting reflected light from the surface and generating a signal in response thereto, a light detector holder for holding the light detector and positioning it so as to detect the reflected light, and a connector for connecting the light detector to a microprocessor to analyze the signal. Also disclosed is a method of analyzing a surface which, in use, is subject to drag.