AUTOMATED INSPECTION

Systems, methods, and related technologies for automated inspection are described. In certain aspects, one or more images of a reference part can be captured and the one or more images of the reference part can be processed to generate an inspection model of the reference part. One or more regions o...

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Hauptverfasser:	RUBNER, Joseph, AVRAHAMI, Nir
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING
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Beschreibung
Zusammenfassung:	Systems, methods, and related technologies for automated inspection are described. In certain aspects, one or more images of a reference part can be captured and the one or more images of the reference part can be processed to generate an inspection model of the reference part. One or more regions of the inspection model can be associated with one or more analysis parameters. An inspection plan can be generated based on the inspection model and the one or more analysis parameters. Based on the inspection plan, one or more images of a part to be inspected can be captured and the one or more images of the part can be processed in relation to the analysis parameters to compute one or more determinations with respect to the part. One or more outputs can be providing based on the one or more determinations.