APPARATUS AND METHOD FOR CONTROLLING AN ATOMIC EMISSION SPECTROMETER

A controller (316) and method for establishing safe operation of an atomic emission spectrometer (AES) to analyze a sample (100) arranged on a sample holder (102) of the AES. The controller (316) is configured to receive a measurement of at least one test parameter indicative of the arrangement of t...

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Bibliographische Detailangaben
Hauptverfasser:	MAULAZ, Tony, FARKAS, Romain
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	BASIC ELECTRIC ELEMENTS COLORIMETRY CORONA DEVICES ELECTRICITY GENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING OVERVOLTAGE ARRESTERS USING SPARK GAPS PHYSICS RADIATION PYROMETRY SPARK GAPS SPARKING PLUGS TESTING
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Beschreibung
Zusammenfassung:	A controller (316) and method for establishing safe operation of an atomic emission spectrometer (AES) to analyze a sample (100) arranged on a sample holder (102) of the AES. The controller (316) is configured to receive a measurement of at least one test parameter indicative of the arrangement of the sample (100) on the sample holder (102). The at least one test parameter is then compared to a range of target values for that test parameter to determine if the sample (100) is arranged correctly on the sample holder (102). The test parameters may include an electrical parameter dependant on a current between a first and a second terminal at the sample holder (102), gas pressure in a gas chamber housing an electrode of the AES, or displacement of a portion of the sample holder.