METHOD FOR FABRICATING FINFET TECHNOLOGY WITH LOCALLY HIGHER FIN-TO-FIN PITCH
The present invention relates to a semiconductor fin device (100) comprising at least three fins (102-106) arranged in parallel and protruding out from a substrate (111), the fins are separated from each other by shallow trench isolation structures (101), at least a first (102) and a second (106) of...
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Format: | Patent |
Sprache: | eng ; fre ; ger |
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Zusammenfassung: | The present invention relates to a semiconductor fin device (100) comprising at least three fins (102-106) arranged in parallel and protruding out from a substrate (111), the fins are separated from each other by shallow trench isolation structures (101), at least a first (102) and a second (106) of the fins protruding to a level higher than an upper surface (107) of the shallow trench isolation structures, the parallel fins are spaced with a first fin spacing (108), with at least one third fin arranged in between a first and a second fin, wherein in a non-protruding region (110) the third fin extends to a level below or equal to the upper surface of the shallow trench isolation structures. |
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