CHEMICAL-MECHANICAL POLISHING COMPOSITION COMPRISING ORGANIC/INORGANIC COMPOSITE PARTICLES

Described are a chemical-mechanical polishing (CMP) composition comprising abrasive particles in the form of organic/inorganic composite particles as well as the use of said composite particles as abrasive particles in a CMP composition and processes for the manufacture of a semiconductor device com...

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Bibliographische Detailangaben
Hauptverfasser: JIANG, Liang, GOLZARIAN, Reza, NOLLER, Bastian Marten, SHEN, Daniel Kwo-Hung, LAN, Yongqing
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:Described are a chemical-mechanical polishing (CMP) composition comprising abrasive particles in the form of organic/inorganic composite particles as well as the use of said composite particles as abrasive particles in a CMP composition and processes for the manufacture of a semiconductor device comprising chemical mechanical polishing of a substrate in the presence said CMP composition.