ESTIMATING SYSTEM PARAMETERS FROM SENSOR MEASUREMENTS

There are described herein methods and systems for estimating a system parameter in a closed loop scheme using a sensor model associated with a sensor performing a measurement of the system parameter. Past and current measurements of the parameter are used to provide an initial estimate of the syste...

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Bibliographische Detailangaben
Hauptverfasser:	MADANI, Kaveh, PEDRAMI, Reza
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	There are described herein methods and systems for estimating a system parameter in a closed loop scheme using a sensor model associated with a sensor performing a measurement of the system parameter. Past and current measurements of the parameter are used to provide an initial estimate of the system parameter (606) and sensor dynamics are used to refine the estimated parameter (606).