PROBE PIN AND ELECTRONIC DEVICE USING SAME

PROBE PIN AND ELECTRONIC DEVICE USING SAME

A probe pin (10) includes a coil spring (50), a first plunger (20), and second and third plungers (30 and 40). The second and third plungers (30 and 40) respectively are independently operable and include a main body (31 and 41) and first and second elastic pieces (32, 42, 34, and 44) that extend fr...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: TERANISHI, Hirotada, SAKAI, Takahiro
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:A probe pin (10) includes a coil spring (50), a first plunger (20), and second and third plungers (30 and 40). The second and third plungers (30 and 40) respectively are independently operable and include a main body (31 and 41) and first and second elastic pieces (32, 42, 34, and 44) that extend from the main body (31 and 41) in the same direction to each other. The first plunger (20) is inserted between the first and second elastic pieces (32, 42, 34, and 44) of each of the second and third plungers (30 and 40).