SYSTEM AND METHOD FOR DETERMINING X-RAY EXPOSURE PARAMETERS

In accordance with one aspect of the present system, an X-ray detector of an X-ray imaging system includes a communication module configured to receive a pre-shot image from a detection circuitry and receive one or more pre-shot parameters from a source controller of the X-ray imaging system. The X-...

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Bibliographische Detailangaben
Hauptverfasser: HEUKENSFELDT JANSEN, Floribertus P.M, ZOU, Yun, ZELAKIEWICZ, Scott Stephen, SAUNDERS, Rowland Frederick, WIEDMANN, Uwe, FRONTERA, Mark Alan, WALIMBE, Vivek
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:In accordance with one aspect of the present system, an X-ray detector of an X-ray imaging system includes a communication module configured to receive a pre-shot image from a detection circuitry and receive one or more pre-shot parameters from a source controller of the X-ray imaging system. The X-ray detector further includes an analysis module configured to determine one or more image characteristics of the pre-shot image. The X-ray detector further includes a determination module configured to calculate one or more main-shot parameters based on the one or more pre-shot parameters and the one or more image characteristics. The determination module is further configured to send the one or more main-shot parameters to the source controller of the X-ray imaging system.